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Facilities
Facilities
Instrument
Atomic force microscope (Bruker, ICMS)
Confocal Micro Raman Microscope (Horiba)
Confocal microscopy (LEICA)
Diamond wire Saw (DWS) (Well)
Differential scanning calorimetry (DSC 3)
Differential scanning calorimetry (TA-DSC 250)
Dynamic Light Scattering (DLS)
Electron paramagnetic resonance spectroscopy (EPR)
Field emission Scanning electron microscope (Apreo 2 S) NANO LAB
Field emission Scanning electron microscope (Zeiss, AMRL)
FTIR-DRIFTS-Thermal Emissivity
High Resolution Mass Spectroscopy (HRMS)
Matrix Assisted Laser Desorption/Ionization (MALDI)
Micro Raman Spectrometer (AMRL)
Nuclear Magnetic resonance (NMR) (400 MHz, Bruker)
Nuclear Magnetic resonance (NMR)(600 MHz, JEOL)
Nuclear Magnetic resonance - NMR Solid State (400 MHz, Bruker)
Optical Microscope (Keyence)
Photoluminescence (PL) (Horiba)
Photoluminescence (temperature Dependent)
Plasma Treatment system
Powder XRD (Bruker)
Powder XRD (Pan Analytical)
Powder XRD (Rigaku)
Single Crystal X-ray Diffractometer (SCXRD)
Superconducting Quantum Interference Device (SQUID)
Thermogravimetric analysis (TGA Mettler)
Thermogravimetric analysis (TGA Perkin Elmer)
Transmission Electron Microscope (JEOL JEM F200)
Transmission electron microscopy (JEOL JEM 2100 Plus)
UV-Vis-NIR Spectroscopy (Agilent)
UV-VIS spectroscopy (Perkin Elmer)
Xray Photoelectron Spectroscopy (XPS) Thermofisher
Thermogravimetric analysis (TGA Perkin Elmer)
Transmission Electron Microscope (JEOL JEM F200)
Transmission electron microscopy (JEOL JEM 2100 Plus)
UV-Vis-NIR Spectroscopy (Agilent)
UV-VIS spectroscopy (Perkin Elmer)
Xray Photoelectron Spectroscopy (XPS) Thermofisher
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